Instrumentation: Scanning Electron Microscope (SEM) In order to examine the surface topography of different pieces of evidence, forensic investigators can employ the powerful Scanning Electron Microscope (SEM). High-resolution imaging with a large depth of focus is possible with SEM,
Instrumentation: Scanning Electron Microscope (SEM) In order to examine the surface topography of different pieces of evidence, forensic investigators can employ the powerful Scanning Electron Microscope (SEM). High-resolution imaging with a large depth of focus is possible with SEM, which makes it appropriate for inspecting objects such as nails, cables, cartridge cases, and bullets. Using […]